Computer Outage Disrupts Student Exams in New York State

Thousands of children were unable to finish annual standardized tests, the second year in a row when technological issues ...
IEEE

An FPGA-Based Emulator and Test System for the 3-D-SOI Chip CPV-4

Abstract: Combining 3-D vertical integration technology for the silicon-on-insulator (SOI) pixel process, the compact pixel for vertex-4 (CPV-4) 3-D chip integrates sensing diode and analog front-end ...
Wired

This Beanie Is Designed to Read Your Thoughts

Speech-to-text capability is now baked into all modern computers. But what if you didn’t have to dictate to your computer? What if you could type just by thinking? Silicon Valley startup Sabi is ...
IEEE

Residual Error Integral Predictor-Based Smith Fuzzy PID Temperature Controller for Thermal Vacuum Test

Abstract: Thermal vacuum test is an important procedure in the development of spacecraft and load. Due to the various layouts of heaters and temperature sensors for kinds of devices under test (DUTs), ...