The laser provides the carrier, which is modulated and manipulated by the transmitter optical engine through fibers and ...

The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and ...

A new technical paper, “Challenges and prospects of 2D electronics for future monolithic complementary field-effect ...

A new technical paper, “Early Functional Safety and PPA evaluation for faster digital design development,” was published by ...

The shift to HBM4 and HBM5 will increase the pressure for shift-left test flows. Taller high-bandwidth memory (HBM) stacks ...

A new technical paper, "Challenges and prospects of 2D electronics for future monolithic complementary field-effect transistors," was published by researchers at Sungkyunkwan University, Hangyang ...

Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.

The industry's aspirations for machine learning are running ahead of the data plumbing required to support them.

Yield ramp has always been a concern in semiconductor manufacturing: systems companies need confidence that devices meet ...

Amid rising supply chain risk and geopolitical uncertainty, attention is turning to regional capability as the semiconductor ...

But behind every AI workload, the most fundamental constraint is power. Fig. 1: AI server market. Source: Grand View Research ...

ATE is evolving from a pure defect-detection system to one that provides system-level validation supported by AI software ...