Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

As the semiconductor industry increasingly moves to chiplets, 2.5D/3D packaging, and heterogeneous integration, there are significant new challenges for test. Leaders like Teradyne have the ...

IEEE today announced IEEE 1149.1-2013 “Standard for Test Access Port and Boundary-Scan Architecture,” which aims to cut costs by means of test reuse from IP to the system level. CJ Clark, Intellitech ...