Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
As boring as propeller designs may seem to the average person, occasionally there’s a bit of a dust-up in the media about a ‘new’ design that promises at least a few percent improvement in performance ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...
Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...
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