In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...
Achieving both high sensitivity and a wide dynamic range remains a central challenge in microelectromechanical accelerometers.
In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...
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